- OCR Reader for wafer ID reading

     - Bond Pad Inspection - Wafer mapping

     - LED Wafer Inspection

     - Mark Inspection System - for several types of IC packages ; both laser and ink marking

     - Intry OCR Reader and mark Inspection system

     - SO Device Inspection System - Mark, Surface, 2D and True Coplanarity Lead

        Inspection - SOT-23, SOD-123, SC-70, SC-88, etc.

     - Matrix Display - OLED Inspection system

     - Leadless Device Inspection system - for QFN, MLP, MLF, SiP, BGY, LGA, etc.

     - Flatlead Device Inspection System - SOT523, SOT723, etc.

     - Leadframe Inspection Systems

     - Algorithm development for Wafer Inspection and microscopy.

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